Andrew Ramsey graduated in physics from the University of Cambridge in 1986 and first developed image analysis software for non-destructive testing (NDT/NDE) at the UK’s Harwell Laboratory. He has worked in X-ray Computed Tomography (CT) since 1992. He joined X-Tek Systems, Tring, UK in 1999 and developed their first CT reconstruction software and in 2006 moved into the Sales Department as a technical advisor. Following the acquisition of X-Tek by Metris and subsequently by Nikon, Andrew joined Nikon Metrology’s X-ray Centre of Excellence supporting CT systems, agents, sales staff and customers worldwide. Since early 2018 Andrew has been supporting sales in the Americas out of Nikon Metrology’s office in Brighton, Michigan.
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